Preparation and characterization of thin layers of II-VI nano-particles
Project management at the University of Würzburg:
This project focuses on the synthesis of binary sulfide-particles (e.g., CdS, ZnS) with diameters between 1.5 and 10 nm and on their characterization using UV/VIS spectroscopy, high-resolution photoemission, x-ray absorption and emission, Raman spectroscopy (in cooperation with TP C3), atomic force microscopy (AFM), and x-ray diffraction (XRD). Organic stabilizers enable a very narrow size distribution. Structural information is gained using different pathways: An estimate of the particle size is obtained from the optical absorption edges, and can be correlated with a profile analysis of the XRD patterns. Additionally, XRD yields information about the crystal structure of the particle core, imperfections, stacking faults and relaxation effects at the surface. From the photoemission results detailed information about the chemical and electronic properties are gained, e.g., regarding the identification of different sulphur species. In a second focus of interest different ways of particle deposition are examined in order to produce well ordered films. Distance correlations in AFM images were found for electrophoretically deposited films.
Projekt period: from 01.1999 to 01.2001